In research to be shared at the prestigious 56th International Reliability Physics Symposium (IRPS), researchers from the Indian Institute of Science Bangalore (IISc) will present a paper that details a breakthrough in significantly improving the reliability limits of 3D FinFET technology in sub-14nm technology for System-on-Chip integration. The study is the result of work in collaboration with Intel that sought to better understand various aspects of electrostatic discharge (ESD), latch-up and hot carrier reliability of ultra-dense FinFET technologies.
In the heart of Central India lies the Panna Tiger Reserve, a sanctuary that has seen a remarkable revival of its tiger population thanks to reintroduction efforts. But how are these majestic creatures adapting to their new environment? A team of researchers from the Wildlife Institute of India (WII) Dehradun is trying to find out.